Volume 22.
(as bibtex)
40 references.
Articles

114. Interaction graphs: Graphical aids for planning experiments
Kacker, Raghu N.,
Tsui, KwokLeung

105110. The lognormal distribution for modeling quality data when the mean is near zero
Albin, Susan L.

111117. The effect of assuming a homogeneous Poisson process when the true process is a power law process
Rigdon, Steven E.,
Basu, Asit P.

118127. Improved curtailed sampling plans for $np$ control charts
Williams, William W.,
Looney, Stephen W.,
Peters, Michael H.

128137. Statistical effects of imperfect inspection sampling, IV. Modified Dorfman screening procedures
Johnson, Norman L.,
Kotz, Samuel,
Rodriguez, Robert N.

138145. Producerconsumer tolerances
Fathi, Yahya

146153. Construction and selection of tightenednormaltightened (TNT) plans
Soundararajan, V.,
Vijayaraghavan, R.

1522. Computer experiments for quality control by parameter design
Welch, William J.,
Yu, TatKwan,
Kang, Sung Mo,
Sacks, Jerome

154162. Average run lengths for exponentially weighted moving average control schemes using the Markov chain approach
Saccucci, Michael S.,
Lucas, James M.

163165. Monitoring reduction in variation with a range chart
Nelson, Lloyd S.

173186. Comparisons of multivariate CUSUM charts
Pignatiello, Joseph J., Jr,
Runger, George C.

187192. The estimation of sigma for an $X$ chart: $\overline{MR}/d_2$ or $S/c_4$? (Corr: V23 p383)
Cryer, Jonathan D.,
Ryan, Thomas P.

193205. Bernoulli trials and discrete distributions
Shapiro, Samuel S.,
Zahedi, Hassan

206209. The adjusted $p$ chart and $u$ chart for varying sample sizes
Rocke, David M.

210222. Minimum cost inspection intervals for a twostate process
Iyer, Hari K.,
Vecchia, Dominic F.

223229. Lower confidence limits on process capability indices (Corr: V24 p251)
Chou, YounMin,
Owen, D. B.,
Borrego A., Salvador A.

2333. Screening designs for constrained mixture experiments derived from classical screening designs
Piepel, Gregory F.

230238. Hazard plotting of left truncated life data
Nelson, Wayne

239244. A computer program for comparison of multiple Poisson means
Heyes, Gerald B.

245246. Setting up a control chart using subgroups of varying sizes
Nelson, Lloyd S.

255259. A different view of the funnel experiment
MacGregor, John F.

260264. A simple method for obtaining resolution IV designs for use with Taguchi's orthogonal arrays
Bullington, Kimball E.,
Hool, James N.,
Maghsoodloo, Saeed

265276. Embedding mixture experiments inside factorial experiments
Cornell, John A.

277282. Accurate estimation of count totals using ratio estimators
Mullenix, Paul

283288. Shewharttype charts for percentiles of strength distributions
Padgett, W. J.,
Spurrier, John D.

289298. Tables of run length percentiles for determining the sensitivity of Shewhart control charts for averages with supplementary runs rules
Palm, Andrew C.

299309. Simple tests of normality in small samples
Ramsey, Patricia P.,
Ramsey, Philip H.

310313. Single sampling plans for variables indexed by AQL and AOQL
Govindaraju, K.

314318. The effects of inspection errors on acceptance sampling for nonconformities
Suich, Ron

319327. Acceptance sampling plans based on the hypergeometric distribution
McWilliams, Thomas P.

328330. Comments on significance tests and confidence intervals
Nelson, Lloyd S.

3437. A control chart for ratios (Corr: V22 p342)
Spisak, Andrew W.

342342. Correction to ``Critical values for a cluster analysis approach to multiple comparisons'' (1990V22 p7477)
Nelson, L. S.

3845. Combining Taguchi and response surface philosophies: A dual response approach
Vining, G. Geoffrey,
Myers, Raymond H.

4656. Percentage points for the Cochran test for equality of variances
Solomon, Herbert,
Stephens, Michael A.

5767. The exact relation of Taguchi's signaltonoise ratio to his quality loss function
Maghsoodloo, Saeed

6873. A program to evaluate the run length distribution of a Shewhart control chart with supplementary runs rules
Champ, Charles W.,
Woodall, William H.

7477. Critical values for a cluster analysis approach to multiple comparisons (Corr: V22 p342; V23 p382)
Nelson, Lloyd S.

8794. Screening outliers in process control regression data with uniform residuals, II
Quesenberry, Charles P.

95104. A nonparametric Bayes empirical Bayes procedure for estimating the percent nonconforming in accepted lots
Martz, H. F.,
Zimmer, W. J.