Volume 48.
(as bibtex)
37 references.
Articles

108117. Branchandbound redundancy optimization for a series system with multiplechoice constraints
Sung, Chang Sup,
Cho, Yong Kwon

118126. Optimal allocation of $s$identical, multifunctional spares in a series system
Prasad, V. R.,
Kuo, W.,
Kim, K. M. O.

127134. A comparison of electronicreliability prediction models
Jones, J.,
Hayes, J.

135140. A setofnumbers is NOT a dataset
Ascher, H. E.

141148. Stepstress lifetesting with random stresschange times for exponential data
Xiong, Chengjie,
Milliken, George A.

149158. Analyzing acclerated degradation data by nonparametric regression
Shiau, JyhJen Horng,
Lin, HsinHua

159168. Availability modeling of modular software
Ledoux, J.

169175. A general imperfectsoftwaredebugging model with $S$shaped faultdetection rate
Pham, Hoang,
Nordmann, L.,
Zhang, Xuemei

176181. Estimation of the stressthreshold for the Weibull inverse power law
Hagwood, Charles,
Clough, Roger,
Fields, Richard

182188. An approach for computing tight numerical bounds on renewal functions
LimonRobles, J.,
Ayhan, Hayriye,
LimÃ³nRobles, J.,
Wortman, Martin A.

189198. Development programs for 1shot systems: Decoupled test and redesigns, with the possibility of design degradation
Moon, Michael J.,
Vardeman, Stephen B.,
McBeth, Douglas

199204. Evaluation of average maintenance cost for imperfectrepair model
Lim, JaeHak,
Park, Dong Ho

224233. Performability analysis of commonchannel signaling networks, based on signaling system #7
Chung, Min Young,
You, Jae Uck,
Sung, Dan Keun,
Choi, Bong Dae

234246. Determining terminalpair reliability based on edge expansion diagrams using OBDD
Kuo, SyYen,
Lu, ShyueKung,
Yeh, FuMin

247255. Maximumshortestpath (MSP): An optimal routing policy for meshconnected multicomputers
Wu, Jie

256261. A fast Monte Carlo method for evaluating reliability indexes
Lieber, Dmitrii,
Nemirovskii, Arkadii,
Rubinstein, Reuven Y.

262266. Mean residual life and its association with failure rate
Ghai, Gauri L.,
Mi, Jie

267274. A separable method for incorporating imperfect faultcoverage into combinatorial models
Amari, S. V.,
Dugan, J. B.,
Misra, R. B.

275284. Optimal reliability of systems subject to imperfect faultcoverage
Amari, S. V.,
Dugan, J. B.,
Misra, R. B.

285291. Comparison of softwarereliabilitygrowth predictions: Neural networks vs parametricrecalibration
Sitte, R.

292299. Using statistics of the extremes for software reliability analysis
Kaufman, L. M.,
Dugan, J. B.,
Johnson, B. W.

300305. Sensitivityanalysis and estimating numberoffaults in removal debugging
Yip, P. S. F.,
Xi, Liqun,
Fong, D. Y. T.,
Hayakawa, Y.

360368. Hierarchical modeling & evaluation of phasedmission systems
Mura, I.,
Bondavalli, A.

369376. Estimating the number of faults: Efficiency of removal, recapture, and seeding
Lloyd, C. J.,
Yip, P. S. F.,
Chan, Kin Sun

377387. A failuretime model for infantmortality and wearout failure modes
Chan, Victor,
Meeker, William Q.

388393. Using repairdepot system reliability to determine the distribution of supportability turnaround time
Linton, D. G.,
Dou, Wei

45. The small appliance and computer industry: Do they forget reliability lessons?
Katz, A.

403412. Online reliability estimation of individual components, using degradation signals
Chinnam, R. B.

413419. Maintenancepolicy costanalysis for a series system with highlycensored data
Reineke, D. M.,
Pohl, E. A.,
Murdock, W. P., Jr.

4249. Weighted voting systems
Nordmann, L.,
Pham, Hoang

5060. A BDDbased algorithm for reliability analysis of phasedmission systems
Zang, Xinyu,
Sun, Hairong,
Trivedi, K. S.

68. Failures and related topics
Yellman, T. W.

6167. Planning stepstress lifetest with a target accelerationfactor
Yeo, KweePoo,
Tang, LoonChing

6872. The exponentiated Weibull family: A graphical approach
Jiang, R.,
Murthy, D. N. P.

7378. Mean residual life of lifetime distributions
Tang, L. C.,
Lu, Y.,
Chew, E. P.

7986. Goodnessoffit tests for typeI extremevalue and 2parameter Weibull distributions
Shimokawa, Toshiyuki,
Liao, Min

918. Approaches for reliability modeling of continuousstate devices
Zuo, Ming J.,
Jiang, Renyan,
Yam, R. C. M.