Current Index to Statistics
IEEE Transactions on Reliability
Hypothesis-test for reliability in a stress-strength model, with prior information
Nandi, S. B.
Aich, A. B.
Modified `practical Bayes-estimators'
Forced-outage rates of generating units based on expert evaluation
Noor, S. Fayyaz
McDonald, J. R.
The use of imprecise component reliability distributions in reliability calculations
Roberts, Ian D.
Samuel, Andrew E.
Fuzzy reliability using a discrete stress-strength interference model
Wang, J. D.
Liu, T. S.
Weibull component reliability-prediction in the presence of masked data
Usher, John S.
Bayes estimation of component-reliability from masked system-life data
Lin, Dennis K. J.
Usher, John S.
Guess, Frank M.
Estimating component-defect probability from masked system success/failure data
Flehinger, Betty J.
Conn, Andrew R.
A cautionary tale about Weibull analysis
Mackisack, M. S.
Stillman, R. H.
Characterization of bivariate mean residual-life function
Kulkarni, H. V.
Rattihalli, R. N.
Linear-spline approximation for semi-parametric modeling of failure data with proportional hazards (STMA V38 1917)
Love, C. E.
A reliability model of a system with dependent components (STMA V38 2380)
Robust parameter-estimation using the bootstrap method for the 2-parameter Weibull distribution
Optimum 3-step step-stress tests
Khamis, Imad H.
Higgins, James J.
Nonparametric model for step-stress accelerated life testing
Tyoskin, Oleg I.
Krivolapov, Sergey Y.
Some results on discrete mean residual life
Salvia, Anthony A.
Engineering notion of mean-residual-life and hazard-rate for finite populations with known distributions
Estimating the cumulative downtime distribution of a highly reliable component
Jeske, Daniel R.
A system-based component test plan for a series system, with type-II censoring
Development test programs for 1-shot systems: 2-state reliability and binary development-test results
Vardeman, Stephen B.
Proportional hazards modeling of time-dependent covariates using linear regression: A case study (STMA V38 3217)
Computational algebra applications in reliability theory (STMA V38 3686)
The use of precautionary loss functions in risk analysis (STMA V38 3705)
Norstroem, J. G.
Norstrom, J. G.
Norstrøm, J. G.
Solving ML equations for 2-parameter Poisson-process models for ungrouped software-failure data (Corr: 1997V46 p349 STMA V39 4232))
Knafl, George J.
Using neural networks to predict software faults during testing (STMA V38 3692)
Khoshgoftaar, T. M.
Szabo, R. M.
Generalized linear models in software reliability: Parametric and semi-parametric approaches (STMA V38 3681)
El Aroui, M.-A.
Bayes estimation for the Pareto failure-model using Gibbs sampling
Tiwari, Ram C.
Zalkikar, Jyoti N.
Hierarchical Bayes estimation for the exponential-multinomial model in reliability and competing risks
Papadopoulos, Alex S.
Tiwari, Ram C.
Zalkikar, Jyoti N.
Predictive Bayes design of Scram systems: Related mathematics and philosophical implications
Clarotti, Carlo A.
A Bayes approach to step-stress accelerated life testing
van Dorp, J. Rene
van Dorp, J. René
Mazzuchi, Thomas A.
Fornell, Gordon E.
Pollock, Lee R.
A Bayes approach to step-stress accelerated life testing (STMA V38 3715)
van Dorp, J. R.
Mazzuchi, T. A.
Fornell, G. E.
Pollock, L. R.
A Bayes ranking of survival distributions using accelerated or correlated data
Zimmer, William J.
Deely, John J.
A reliability-growth model in a Bayes-decision framework
How to model reliability-growth when times of design modifications are known
Needed resources for software module test, using the hyper-geometric software reliability growth model (STMA V38 5088)
A conservative theory for long-term reliability-growth prediction (STMA V38 5078)
A survey of discrete reliability-growth models
Comparing the importance of system components by some structural characteristics
Meng, Fan C.
Accelerated life tests for products of unequal size
Bai, D. S.
Yun, H. J.
Accelerated life tests analyzed by a piecewise exponential distribution via generalized linear models
Barbosa, Emanuel P.
Colosimo, Enrico A.
Optimal release policy for hyper-geometric distribution software-reliability growth model (STMA V38 5089)
A Bayes nonparametric framework for software-reliability analysis (STMA V38 5084)
The failure of Bayes system reliability inference based on data with multi-level applicability
Philipson, Lloyd L.
Bayes and classical estimation of environmental factors for the binomial distribution
Elsayed, E. A.
Prediction intervals for Weibull observations, based on early-failure data
Hsieh, H. K.
Confidence interval for the mean of the exponential distribution, based on grouped data
A coherent model for reliability of multiprocessor networks (STMA V38 5079)
Failure-rate functions for doubly-truncated random variables
Ruiz, Jose M.
Analysis of step-stress accelerated-life-test data: A new approach
Tang, L. C.
Sun, Y. S.
Goh, T. N.
Ong, H. L.
A discretizing approach for stress/strength analysis
English, John R.
Landers, Thomas L.
An input-domain based method to estimate software reliability (STMA V38 1002)
De Agostino, E.
Di Marco, G.