Volume 29.
(as bibtex)
56 references.
Articles

115. Robust empirical Bayes analyses of event rates
Gaver, Donald P.,
O'Muircheartaigh, I. G.

103107. Multiple attributes sampling acceptance plans involving destructive testing
Speevak, T.,
Yu, A. K.

109112. An improved estimator of the mean for a sequential binomial sampling plan
Kremers, Walter K.

125125. Reply to comments on ``A multistage procedure for detecting several outliers in linear regression''
Marasinghe, Mervyn G.

125125. Comments on ``A multistage procedure for detecting several outliers in linear regression'' (V27 p395399)
Fung, W. K.

127142. Brushing scatterplots
Becker, Richard A.,
Cleveland, William S.

143151. Large sample properties of simulations using Latin hypercube sampling (Corr: V32 p367)
Stein, Michael

153160. Monte Carlo estimation under different distributions using the same simulation
Beckman, Richard J.,
McKay, Michael D.

161172. The application of ridge techniques to mixture data: Ridge analysis
Hoerl, Roger W.

1722. Fitting the Student$t$ distribution to grouped data, with application to a particle scattering experiment
Beckman, Richard J.,
Johnson, Mark E.

173181. A sequential experimental design for estimating a scale parameter from quantal life testing data
Morris, Max D.

183191. Bias correction for a generalized loggamma regression model
Young, David H.,
Bakir, Saad T.

193204. Higherorder crossings in time series model identification
Kedem, Benjamin

205210. Welch's approximate solution for the BehrensFisher problem
Best, D. J.,
Rayner, J. C. W.

211219. A robust confidence interval for location
Mond, Charles E. Du,
Lenth, Russell V.

221228. Bayesian analysis of learning in risk analyses
Hora, Stephen C.,
Iman, Ronald L.

229236. MINQE for the oneway classification
Conerly, M. D.,
Webster, J. T.

2332. An application of imputation to an estimation problem in grouped lifetime analysis
Tanner, Martin A.,
Wong, Wing Hung

251252. In memoriam: William G. Hunter, 19371986
Box, George

253265. Performance measures independent of adjustment: An explanation and extension of Taguchi's signaltonoise ratios (C/R: p266281; p283285)
Leon, Ramon V.,
Shoemaker, Anne C.,
Kacker, Raghu N.

266266. Comments on ``Performance measures independent of adjustment: An explanation and extension of Taguchi's signaltonoise ratios''
Boardman, Thomas J.

267269. Comments on ``Performance measures independent of adjustment: An explanation and extension of Taguchi's signaltonoise ratios''
Easterling, Robert G.

270270. Comments on ``Performance measures independent of adjustment: An explanation and extension of Taguchi's signaltonoise ratios''
Box, George,
Fung, Conrad A.

271273. Comments on ``Performance measures independent of adjustment: An explanation and extension of Taguchi's signaltonoise ratios''
Dehnad, Khosrow

274277. Comments on ``Performance measures independent of adjustment: An explanation and extension of Taguchi's signaltonoise ratios''
Pignatiello, Joseph J., Jr,
Ramberg, John S.

279281. Comments on ``Performance measures independent of adjustment: An explanation and extension of Taguchi's signaltonoise ratios''
Wu, C. F. J.

283285. Reply to comments on ``Performance measures independent of adjustment: An explanation and extension of Taguchi's signaltonoise ratios''
Leon, Ramon V.,
Shoemaker, Anne C.,
Kacker, Raghu N.

287299. Diagnostics and robust estimation when transforming the regression model and the response
Carroll, R. J.,
Ruppert, David

301309. Confidence bands for twostage design problems
Cheng, R. C. H.

311321. Optimal callrecord sampling for network planning and administration
Pack, C. D.,
Saad, S. Ben

323337. A Bayesian approach to the estimation of variance components for the unbalanced oneway random model
Chaloner, Kathryn

3340. Approximate inference for the generalized gamma distribution
DiCiccio, T. J.

339349. Parameter and quantile estimation for the generalized Pareto distribution
Hosking, J. R. M.,
Wallis, J. R.

351357. A measure of topdown correlation (Corr: V31 p133)
Iman, Ronald L.,
Conover, W. J.

359370. Onesided intervals for at least $p$ of $m$ observations from a normal population on each of $r$ future occasions (Corr: V30 p469)
Davis, Charles B.,
McNichols, Roger J.

371376. Approximate simultaneous prediction intervals for multiple forecasts
Ravishanker, Nalini,
Hochberg, Yosef,
Melnick, Edward L.

393399. Exact results for Shewhart control charts with supplementary runs rules
Champ, Charles W.,
Woodall, William H.

401407. A simple method for studying runlength distributions of exponentially weighted moving average charts
Crowder, Stephen V.

409412. A note on multivariate CUSUM procedures
Healy, John D.

4149. Performance of likelihoodbased interval estimates for twoparameter exponential samples subject to Type I censoring
Piegorsch, Walter W.

413426. Diagnostics for mixedmodel analysis of variance (Corr: V32 p241)
Beckman, Richard J.,
Nachtsheim, Christopher J.,
Cook, R. Dennis

427433. Addedvariable plots in linear regression
Johnson, Bradford W.,
McCulloch, Robert E.

435438. Residual plots for detecting nonlinearity in generalized linear models
Wang, P. C.

439447. The application of the annealing algorithm to the construction of exact optimal designs for linearregression models
Haines, Linda M.

449453. A class of multifactor designs for estimating the slope of response surfaces
Park, Sung H.

455460. Bayesian control in mixture models
Berliner, L. Mark

461469. Trendsurface models with regional and local scales of variation with an application to aerial survey data
Haining, Robert

471476. Tests for exponentiality when origin and scale parameters are unknown
Spinelli, John J.,
Stephens, Michael A.

477485. Economic design of a onesided screening procedure using a correlated variable
Tang, Kwei

504505. Comments on ``A note on the use of prior interval information in constructing interval estimates for a gamma mean'' (V28 p269273)
Grieve, A. P.

505506. Reply to comments on ``A note on the use of prior interval information in constructing interval estimates for a gamma mean''
Gladen, Beth C.,
Piegorsch, Walter W.

5165. Limited failure population life tests: Application to integrated circuit reliability
Meeker, William Q., Jr

6782. Computational experience with confidence regions and confidence intervals for nonlinear least squares
Donaldson, Janet R.,
Schnabel, Robert B.

8390. Detecting skewed errors from regression residuals
Boos, Dennis D.

9193. A comparison of alternative tests for lack of fit
Draper, Norman R.,
Guttman, Irwin

95101. The use of marginal likelihood for a diagnostic test for the goodness of fit of the simple linear regression model
Yanagimoto, Takemi,
Yanagimoto, Masakatsu