Field-failure and warranty prediction based on auxiliary use-rate information

Hong, Yili, Meeker, William Q. . Technometrics 2010. 52 (2) :148-159

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Bibtex

@article{CIS-252078,
  Author = {Hong, Yili and Meeker, William Q.},
  Title = {Field-failure and warranty prediction based on auxiliary use-rate information},
  Journal = {Technometrics},
  Volume = {52},
  Number = {2},
  Year = {2010},
  Pages = {148--159},
  Keywords = {Calibration, Risk analysis, Prediction intervals, cycles to failure, product reliability, Multiple failure modes}
}

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