Scale adjustments for classifiers in high-dimensional, low sample size settings

Chan, Yao-Ban, Hall, Peter . Biometrika 2009. 96 (2) :469-478

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Bibtex

@article{CIS-243209,
  Author = {Chan, Yao-Ban and Hall, Peter},
  Title = {Scale adjustments for classifiers in high-dimensional, low sample size settings},
  Journal = {Biometrika},
  Volume = {96},
  Number = {2},
  Year = {2009},
  Pages = {469--478},
  Keywords = {Location difference, support vector machine, centroid method, average-distance classifier, distance-based classifier, nearest-neighbour method}
}

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