Spatial point pattern analysis by using Voronoi diagrams and Delaunay tessellations – a comparative study

Chiu, S. N. . Biometrical Journal 2003. 45 (3) :367-376

Locate this article in:

Bibtex

@article{CIS-223088,
  Author = {Chiu, S. N.},
  Title = {Spatial point pattern analysis by using Voronoi diagrams and Delaunay tessellations – a comparative study},
  Journal = {Biometrical Journal},
  Volume = {45},
  Number = {3},
  Year = {2003},
  Pages = {367--376},
  Keywords = {Goodness of fit, complete spatial randomness}
}

Similar articles