Sample size and number of failure requirements for demonstration tests with log-location-scale distributions and failure censoring

McKane, Scott W., Escobar, Luis A., Meeker, William Q. . Technometrics 2005. 47 (2) :182-190

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Bibtex

@article{CIS-189844,
  Author = {McKane, Scott W. and Escobar, Luis A. and Meeker, William Q.},
  Title = {Sample size and number of failure requirements for demonstration tests with log-location-scale distributions and failure censoring},
  Journal = {Technometrics},
  Volume = {47},
  Number = {2},
  Year = {2005},
  Pages = {182--190},
  Keywords = {Maximum likelihood, Reliability, Simulation}
}

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