Semiparametric maximum likelihood for nonlinear regression with measurement errors

Suh, Eun-Young, Schafer, Daniel W. . Biometrics 2002. 58 (2) :448-453

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Bibtex

@article{CIS-178052,
  Author = {Suh, Eun-Young and Schafer, Daniel W.},
  Title = {Semiparametric maximum likelihood for nonlinear regression with measurement errors},
  Journal = {Biometrics},
  Volume = {58},
  Number = {2},
  Year = {2002},
  Pages = {448--453},
  Keywords = {Structural model, Errors-in-variables, Mixture model, EM algorithm, Nonparametric maximum likelihood, growth-curve analysis, internal validation, measurement error model regression, vertex direction methods, von Bertalanffy model}
}

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