Optimum step-stress accelerated life tests with competing causes of failure under an exponential distribution

Liu, Lixi, Ge, Guangping . Chinese Journal of Applied Probability and Statistics 1999. 15 (4) :351-362

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Bibtex

@article{CIS-154531,
  Author = {Liu, Lixi and Ge, Guangping},
  Title = {Optimum step-stress accelerated life tests with competing causes of failure under an exponential distribution},
  Journal = {Chinese Journal of Applied Probability and Statistics},
  Volume = {15},
  Number = {4},
  Year = {1999},
  Pages = {351--362},
  Keywords = {Reliability, Censored data, Life testing, Survival analysis}
}

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