Accelerated degradation tests: Modeling and analysis

Meeker, William Q., Escobar, Luis A., Lu, C. Joseph . Technometrics 1998. 40 :89-99

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  Author = {Meeker, William Q. and Escobar, Luis A. and Lu, C. Joseph},
  Title = {Accelerated degradation tests: Modeling and analysis},
  Journal = {Technometrics},
  Volume = {40},
  Year = {1998},
  Pages = {89--99},
  Keywords = {Maximum likelihood estimation, Reliability, Random effect, Mixed model, Bootstrap, Nonlinear estimation}

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